Reliability of HfO2-based FeFET memory

cris.virtual.department	#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.orcid	0000-0001-6121-0069
cris.virtualsource.department	89a91aff-dba9-4deb-bc4c-d5206f2f4e17
cris.virtualsource.orcid	89a91aff-dba9-4deb-bc4c-d5206f2f4e17
dc.contributor.author	Ichihara, Reika
dc.contributor.author	Pesic, Milan D.
dc.contributor.author	Higashi, Yusuke
dc.contributor.author	Park, Min Hyuk
dc.date.accessioned	2026-01-22T13:59:04Z
dc.date.available	2026-01-22T13:59:04Z
dc.date.createdwos	2025-09-19
dc.date.issued	2025-09-16
dc.description.wosFundingText	M.H.P. was supported by the Institute for Information and communications Technology Promotion (IITP) Grant funded by the Ministry of Science and Information and Communication Technology of Korea (RS-2024-00399394).
dc.identifier.doi	10.1557/s43577-025-00967-y
dc.identifier.issn	0883-7694
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/58708
dc.language.iso	eng
dc.provenance.editstepuser	greet.vanhoof@imec.be
dc.publisher	SPRINGER HEIDELBERG
dc.source.beginpage	1053
dc.source.endpage	1065
dc.source.issue	9
dc.source.journal	MRS BULLETIN
dc.source.numberofpages	13
dc.source.volume	50
dc.title	Reliability of HfO2-based FeFET memory
dc.type	Journal article review
dspace.entity.type	Publication
imec.internal.crawledAt	2025-10-22
imec.internal.source	crawler
Files
Publication available in collections:	Articles