Browsing by Author "Pavan, Paolo"
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Publication A comprehensive understanding of the erase of TANOS memories through charge separation experiments and simulations
Journal article2011, IEEE Transactions on Electron Devices, (58) 9, p.3147-3155Publication Effects of border traps on transfer curve hysteresis and split-CV mobility measurement in InGaAs quantum-well MOSFETs
Proceedings paper2016, Compound Semiconductor Week, 26/06/2016Publication Probing defects generation during stress in high- $j/metal gate FinFETs by random telegraph noise characterization
Proceedings paper2016, 46th European Solid-State Device Research Conference - ESSDERC, 12/09/2016, p.252-255Publication Role of holes and electrons during erase of TANOS memories: evidence for dipole formation and its impact on reliability
Proceedings paper2010, 48th Annual IEEE International Reliability Physics Symposium - IRPS, 2/05/2010, p.731-737