Publication:

Effects of border traps on transfer curve hysteresis and split-CV mobility measurement in InGaAs quantum-well MOSFETs

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

1893 since deposited on 2021-10-23
1last month
Acq. date: 2025-12-08

Citations

Metrics

Views

1893 since deposited on 2021-10-23
1last month
Acq. date: 2025-12-08

Citations