Publication:
Effects of border traps on transfer curve hysteresis and split-CV mobility measurement in InGaAs quantum-well MOSFETs
Date
| dc.contributor.author | Pavan, Paolo | |
| dc.contributor.author | Puglisi, F. M. | |
| dc.contributor.author | Zagni, Nicolo | |
| dc.contributor.author | Alian, AliReza | |
| dc.contributor.author | Thean, Aaron | |
| dc.contributor.author | Collaert, Nadine | |
| dc.contributor.author | Verzellesi, G. | |
| dc.contributor.imecauthor | Alian, AliReza | |
| dc.contributor.imecauthor | Thean, Aaron | |
| dc.contributor.imecauthor | Collaert, Nadine | |
| dc.contributor.orcidimec | Collaert, Nadine::0000-0002-8062-3165 | |
| dc.date.accessioned | 2021-10-23T13:36:08Z | |
| dc.date.available | 2021-10-23T13:36:08Z | |
| dc.date.issued | 2016 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/27127 | |
| dc.source.conference | Compound Semiconductor Week | |
| dc.source.conferencedate | 26/06/2016 | |
| dc.source.conferencelocation | Toyama Japan | |
| dc.title | Effects of border traps on transfer curve hysteresis and split-CV mobility measurement in InGaAs quantum-well MOSFETs | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
| Publication available in collections: |