Browsing by Author "Pavanello, Marcelo Antonio"
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Publication Analysis of temperature variation influence on the analog performance of 45° rotated triple-gate nMuGFETs
Journal article2012, Solid-State Electronics, (70) 1, p.39-43Publication Analysis of uniaxial and biaxial strain impact on the linearity of fully depleted SOI nMOSFETs
Journal article2007, Solid-State Electronics, (51) 9, p.1194-1200Publication Harmonic distortion of 2-MOS structures for MOSFET-C filters implemented with n-type unstrained and strained FINFETS
Journal article2011, Solid-State Electronics, (62) 1, p.99-105Publication Influence of fin width on the intrinsic voltage gain of standard and strained triple-gate nFinFETs
Proceedings paper2008, Microelectronics Technology and Devices - SBMicro, 1/09/2008, p.253-261