imec Institutional Repository Browsing {{ collection }} by Author "Peaker, A.R."

Publication

Germanium CMOS... Implantation, doping and defects

Peaker, A.R.

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Markevich, V.P.

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Satta, Alessandra

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Simoen, Eddy

Proceedings paper

2009, ISTC/CSTIC. Symposium VIII: Emerging Semiconductor Technologies, 19/03/2009, p.199

Publication

Hydrogen induced positive charge in Hf-based dielectrics

Zhao, C.Z.

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Zhang, J.F.

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Zahid, Mohammed

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Efthymiou, E.

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Lu, Y.

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Hall, S.

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Peaker, A.R.

Journal article

2007, Microelectronic Engineering, (84) 9_10, p.2354-2357

Publication

Impact of different defects on the kinetics of Negative Bias Temperature Instability of Hafnium stacks

Zhang, J.F.

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Zhao, C.Z.

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Chang, M.H.

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Zahid, Mohammed

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Peaker, A.R.

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Hall, S

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Groeseneken, Guido

Journal article

2008, Applied Physics Letters, (92) 1, p.13501

Publication

Process-induced positive charges in Hf-based gate stacks

Zhao, C.Z.

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Zhang, J.F.

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Chang, M.H.

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Peaker, A.R.

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Hall, S.

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Groeseneken, Guido

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Pantisano, Luigi

Journal article

2008, Journal of Applied Physics, (103) 1, p.14507

Publication

Vacancy clusters in germanium

Peaker, A.R.

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Markevich, V.P.

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Slotte, J.

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Kuitunen, K.

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Tuomisto, F.

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Satta, Alessandra

Proceedings paper

2008, Gettering and Defect Engineering in Semiconductor Technology XII, 14/10/2007, p.125-130

Browsing by Author "Peaker, A.R."