Browsing by Author "Penaud, J."
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Publication Capacitance-voltage (CV) characterization of GaAs/high-k oxide interfaces
Meeting abstract2008, 214th ECS Meeting, 12/10/2008, p.1973Publication Defect density reduction of the Al2O3/GaAs(001) interface by using H2S molecular beam passivation
Journal article2011, Surface Science, (605) 19_20, p.1778-1783Publication Interface properties improvement of Ge/Al2O3 and Ge/GeO2/Al2O3 gate stacks using molecular beam deposition
Meeting abstract2008, 214th ECS Meeting, 12/10/2008, p.1963