Browsing by Author "Pesic, Milan"
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Publication A sensitivity map-based approach to profile defects in MIM capacitors from I-V, C-V and G-V measurements
Journal article2019, IEEE Transactions on Electron Devices, (66) 4, p.1892-1998Publication Understanding and variability of lateral charge migration in 3D CT-NAND flash with and without band-gap engineered barriers
Proceedings paper2019, 2019 IEEE International Reliability Physics Symposium - IRPS, 31/03/2019, p.7C.1Publication Vertical ferroelectric HfO2 FET based on 3-D NAND architecture: towards dense low-power memory
Proceedings paper2018, IEEE International Electron Devices Meeting - IEDM, 1/12/2018, p.43-46