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Understanding and variability of lateral charge migration in 3D CT-NAND flash with and without band-gap engineered barriers
Publication:
Understanding and variability of lateral charge migration in 3D CT-NAND flash with and without band-gap engineered barriers
Date
2019
Proceedings Paper
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40317.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Padovani, Andrea
;
Pesic, Milan
;
Anik Kumar, Mondol
;
Blomme, Pieter
;
Subirats, Alexandre
;
Vadakupudhu Palayam, Senthil
;
Baten, Zunaid
;
Larcher, Luca
;
Van den Bosch, Geert
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2027
since deposited on 2021-10-27
Acq. date: 2025-10-24
Citations
Metrics
Views
2027
since deposited on 2021-10-27
Acq. date: 2025-10-24
Citations