Browsing by Author "Pobegen, G."
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Publication Analytic modeling of the bias temperature instability using capture/emission time maps
Publication Characterization and physical modeling of the temporal evolution of near-interfacial states resulting from NBTI/PBTI stress in nMOS/pMOS transistors
Publication Hydrogen-related volatile defects as the possible cause for the recoverable component of NBTI
Publication Implications of gate-sided hydrogen release for post-stress degradation build-up after BTI stress