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Browsing by Author "Polleunis, C."

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    Advanced characterisation : an indispensable tool for ultra clean processing

    Vandervorst, Wilfried  
    ;
    Bender, Hugo  
    ;
    Storm, Wolfgang
    ;
    Heyns, Marc  
    ;
    Polleunis, C.
    ;
    Bertrand, P.
    Journal article
    1995, Microelectronic Engineering, (28) 1_4, p.27-34
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    Degradation of clean Si-surfaces due to storage in clean (?) wafer boxes

    Storm, Wolfgang
    ;
    Vandervorst, Wilfried  
    ;
    Alay, Josep Lluis
    ;
    Meuris, Marc  
    ;
    Opdebeeck, Ann  
    Proceedings paper
    1994, Proceedings of the 2nd International Symposium on Ultra Clean Processing of Silicon Surfaces - UCPSS, 19/09/1994, p.367-370
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    Just-Clean- Enough technology for the 21st century

    Heyns, Marc  
    ;
    Meuris, Marc  
    ;
    Mertens, Paul  
    ;
    Hurd, Trace
    ;
    Schmidt, Harald
    ;
    Depas, Michel
    Oral presentation
    1995, SEMICON Europe

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