Browsing by Author "Puglisi, Francesco Maria"
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Publication Advanced Data Encryption using 2D Materials
Journal article2021, ADVANCED MATERIALS, (33) 27Publication Probing defects generation during stress in high- $j/metal gate FinFETs by random telegraph noise characterization
Proceedings paper2016, 46th European Solid-State Device Research Conference - ESSDERC, 12/09/2016, p.252-255Publication Standards for the Characterization of Endurance in Resistive Switching Devices
Journal article review2021, ACS NANO, (15) 11, p.17214-17231