Repository logo Institutional repository
  • Communities & Collections
  • Browse
  • Site
Search repository
High contrast
  1. Home
  2. Browse by Author

Browsing by Author "Raskin, J.P."

Filter results by typing the first few letters
Now showing 1 - 15 of 15
  • Results Per Page
  • Sort Options
  • Loading...
    Thumbnail Image
    Publication

    Challenges and perspectives for millimeter and submillimeter wave applications

    Stiens, Johan  
    ;
    Koers, G.
    ;
    Poesen, Gert
    ;
    Kuijk, Maarten
    ;
    De Raedt, Walter  
    ;
    Beyne, Eric  
    ;
    Huynen, I.
    Proceedings paper
    2003, Proceedings of IPSI - The Int. Conf. on Advances in the Internet, Processing, Systems, and Interdisciplinary Research, 5/10/2003
  • Loading...
    Thumbnail Image
    Publication

    Fast and accurate modeling of large TSV arrays in 3D-ICs using a 3D circuit model validated against full-wave FEM simulations and RF measurements

    Rack, Martin
    ;
    Raskin, J.P.
    ;
    Sun, Xiao  
    ;
    Van der Plas, Geert  
    ;
    Absil, Philippe  
    ;
    Beyne, Eric  
    Proceedings paper
    2016, IEEE 66th Electronic Components and Technology Conference - ECTC, 31/05/2015, p.966-971
  • Loading...
    Thumbnail Image
    Publication

    FinFET analogue characterization from DC to 110 GHz

    Lederer, Dimitri  
    ;
    Kilchytska, V.
    ;
    Rudenko, T.
    ;
    Collaert, Nadine  
    ;
    Flandre, D.
    ;
    Dixit, Abhisek
    Journal article
    2005, Solid-State Electronics, (49) 5, p.1488-1496
  • Loading...
    Thumbnail Image
    Publication

    Influence of device engineering on the analog and RF performances of SOI MOSFETs

    Kilchytska, V.
    ;
    Nève, A.
    ;
    Vancaillie, L.
    ;
    Levacq, D.
    ;
    Adriaensen, S.
    ;
    van Meer, Hans
    ;
    Raynaud, C.
    Journal article
    2003, IEEE Trans. Electron Devices, (50) 3, p.577-588
  • Loading...
    Thumbnail Image
    Publication

    Influence of HALO implantation on analog performance and comparison between bulk, partially-depleted and fully-depleted MOSFET's

    Vancaillie, L.
    ;
    Kilchytska, V.
    ;
    Levacq, D.
    ;
    Adriaensen, S.
    ;
    van Meer, Hans
    ;
    De Meyer, Kristin  
    Proceedings paper
    2002, IEEE International SOI Conference, 7/10/2002, p.161-162
  • Loading...
    Thumbnail Image
    Publication

    Investigation of charge control related performances in double-gate SOI MOSFETs

    Kilchytska, V.
    ;
    Chung, T.M.
    ;
    van Meer, Hans
    ;
    De Meyer, Kristin  
    ;
    Raskin, J.P.
    ;
    Flandre, D.
    Proceedings paper
    2003, Silicon-on-Insulator Technology and Devices XI, 28/04/2003, p.225-230
  • Loading...
    Thumbnail Image
    Publication

    Investigation of TSV noise coupling in 3D-ICs using an experimental validated 3D TSV circuit model including Si substrate effects and TSV capacitance inversion behavior after wafer thinning

    Sun, Xiao  
    ;
    Rack, Martin
    ;
    Van der Plas, Geert  
    ;
    Stucchi, Michele  
    ;
    De Vos, Joeri  
    ;
    Absil, Philippe  
    Proceedings paper
    2016, IEEE MTT-S International Microwave Symposium - IMS, 22/05/2016, p.1-4
  • Loading...
    Thumbnail Image
    Publication

    Noise coupling between TSVs and active devices: planar nMOSFETs vs. nFinFETs

    Sun, Xiao  
    ;
    Rouhi Najaf Abadi, Alireza
    ;
    Guo, Wei  
    ;
    Bel Ali, K.
    ;
    Rack, M.
    ;
    Roda Neve, Cesar
    ;
    Choi, M.
    Proceedings paper
    2015, IEEE 65th Electronic Components & Technology Conference - ECTC, 26/05/2015, p.260-265
  • Loading...
    Thumbnail Image
    Publication

    Non-linear performance comparison for FD and PD SOI MOSFETs based on the integral function method and Volterra modelling

    Parvais, Bertrand  
    ;
    Cerdeira, A.
    ;
    Schreurs, Dominique  
    ;
    Raskin, J.P.
    Journal article
    2005, International Journal of Numerical Modelling - Electronic Networks, Devices and Fields, (18) 4, p.283-296
  • Loading...
    Thumbnail Image
    Publication

    On the origin of the excess low-frequency noise in graded-channel silicon-on-insulator nMOSFETs

    Simoen, Eddy  
    ;
    Claeys, Cor
    ;
    Chung, T.M.
    ;
    Flandre, D.
    ;
    Raskin, J.P.
    Journal article
    2007, IEEE Electron Device Letters, (28) 10, p.919-921
  • Loading...
    Thumbnail Image
    Publication

    One-mask CMOS compatible process for the fabrication of three-dimensional self-assembled thin-film SOI microelectromechanical systems

    Iker, Francois
    ;
    André, N.
    ;
    Pardoen, T.
    ;
    Raskin, J.P.
    Journal article
    2005, Electrochemical and Solid State Letters, (8) 10, p.H87-H89
  • Loading...
    Thumbnail Image
    Publication

    Optoelectronic control of coplanar transmission lines up to 110 GHz

    Stiens, Johan  
    ;
    Poesen, Gert
    ;
    Koers, G.
    ;
    Simon, P.
    ;
    Raskin, J.P.
    ;
    Huynen, I.
    ;
    De Raedt, Walter  
    Proceedings paper
    2004, Microwave and Terahertz Photonics, 26/04/2004, p.101-108
  • Loading...
    Thumbnail Image
    Publication

    Photo-induced switching of microwave and millimeter-wave signals on coplanar waveguides

    Koers, G.
    ;
    Poesen, G.
    ;
    Raskin, J.P.
    ;
    Simon, P.
    ;
    Stiens, J.
    ;
    Huynen, I.
    ;
    Vounckx, Roger  
    Proceedings paper
    2002, Proceedings of the 7th Annual Symposium of the IEEE/LEOS Benelux Chapter, 9/12/2002, p.257-260
  • Loading...
    Thumbnail Image
    Publication

    The length-dependence of the 1/f noise of graded-channel SOI nMOSFETs

    Simoen, Eddy  
    ;
    Claeys, Cor
    ;
    Chung, T.M.
    ;
    Flandre, D.
    ;
    Raskin, J.P.
    Proceedings paper
    2007, Microelectonics Technology and Devices SBMICRO 2007, 3/09/2007, p.373-381
  • Loading...
    Thumbnail Image
    Publication

    The low-frequency noise behaviour of graded-channel SOI nMOSFETs

    Simoen, Eddy  
    ;
    Claeys, Cor
    ;
    Chung, T.M.
    ;
    Flandre, D.
    ;
    Pavanello, M.A.
    ;
    Martino, J.A.
    ;
    Raskin, J.P.
    Journal article
    2007, Solid-State Electronics, (51) 2, p.260-267

Follow imec on

VimeoLinkedInFacebook

The repository

  • Contact us
  • Policy
  • About imec
Privacy statement | Cookie settings