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Browsing by Author "Richardson, Paul"

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    Bottom-ARC optimization methodology for 0.25μm lithography and beyond

    Op de Beeck, Maaike  
    ;
    Vandenberghe, Geert  
    ;
    Jaenen, Patrick  
    ;
    Feng, Hong Zhang
    ;
    Delvaux, Christie  
    Proceedings paper
    1998, Optical Microlithography XI, 25/02/1998, p.322-336
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    In situ gas analysis on an RTP tool with APIMS

    Vereecke, Guy  
    ;
    Kondoh, Eiichi
    ;
    Richardson, Paul
    ;
    Maex, Karen  
    ;
    Heyns, Marc  
    ;
    Nényei, Z.
    Proceedings paper
    1998, 44th Annual Meeting of Inst. Environmental Science and Technology, 26/04/1998, p.519-526
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    Wafer thermal desorption spectrometry in a rapid thermal processor using atmospheric pressure ionization mass spectrometry

    Vereecke, Guy  
    ;
    Kondoh, Eiichi
    ;
    Richardson, Paul
    ;
    Maex, Karen  
    ;
    Heyns, Marc  
    Journal article
    2000, IEEE Trans. Semiconductor Processing, (13) 3, p.315-321

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