Browsing by Author "Ries, Michael"
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Publication N+/P and P+/N junctions in strained Si on thin Strain Relaxed SiGe buffers: the effect of defect density and layer structure
Proceedings paper2005, Semiconductor Defect Engineering - Materials, Synthetic Structures, and Devices, 28/03/2005, p.119-124Publication Non-selective and selective thin SiGe strain-relaxed buffer layers: growth and carbon-induced relaxation
Proceedings paper2005, 4th International conference on Silicon Epitaxy and Heterostructures - ICSI-4, 23/05/2005Publication Thin SiGe strain-relaxed buffer layers: carbon-induced relaxation
Proceedings paper2005, ICSI-4, 4th International Conference on Silicon Epitaxy and Heterostructures, 23/05/2005Publication Thin SiGe strain-relaxed buffer layers: relaxation mechanism and integration in strained Si MOS-FETs
Oral presentation2005, Institute of Thin Films and Interfaces