Publication:
N+/P and P+/N junctions in strained Si on thin Strain Relaxed SiGe buffers: the effect of defect density and layer structure
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2039 since deposited on 2021-10-16
Acq. date: 2026-01-06
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Views
2039 since deposited on 2021-10-16
Acq. date: 2026-01-06
Citations