Browsing by Author "Roca, Elisenda"
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Publication Challenges and solutions to the defect-centric modeling and circuit simulation of time-dependent variability
Proceedings paper2023, 61st IEEE International Reliability Physics Symposium (IRPS), MAR 26-30, 2023Publication CoSi2Si1-xGx-interfaces for Schottky barrier infrared detectors with extended detection regime
Proceedings paper1995, Growth and Characterization of Materials for Infrared Detectors II, 13/07/1995, p.175-84Publication Electro-optical characterization of epitaxial and polycrystalline CoSi2 Schottky diodes
Proceedings paper1995, Infrared Technology XXI; 9-13 July 1995; San Diego, CA, USA., p.465-61Publication Increase in the infrared response of silicide schottky barrier diodes by grain boundary scattering
Journal article1995, Appl. Phys. Lett., (67) 10, p.1372-1374Publication Influence of grain boundary scattering in the infrared response of silicide Schottky barrier diodes
Journal article1996, Journal of Appl Physics, (79) 8, p.4426-4430Publication Infrared response of epitaxial and polycrystalline CoSi2 Schottky diodes
Journal article1998, Materials Science and Technology, (14) 12, p.1303-1306Publication Non-destructive characterization of the uniformity of thin cobalt disilicide films by Raman microprobe measurements
;Pérez-Rodríguez, A. ;Roca, Elisenda ;Jawhari, T. ;Morante, J. R.Schreutelkamp, RobJournal article1994, Thin Solid Films, 251, p.45-50Publication Non-destructive thickness determination of thin cobalt and cobalt disilicide layers on silicon substrates
;Roca, Elisenda ;Vanhellemont, Jan ;Schreutelkamp, RobVermeiren, JanJournal article1994, Thin Solid Films, 240, p.110-113Publication Statistical threshold voltage shifts caused by BTI and HCI at nominal and accelerated conditions
;Saraza-Canflanca, Pablo ;Rodriguez, Rosana ;Martin-Martinez, JavierCastro-Lopez, RafaelJournal article2021, SOLID-STATE ELECTRONICS, 185