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Browsing by Author "Roca, Elisenda"

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    Challenges and solutions to the defect-centric modeling and circuit simulation of time-dependent variability

    Martin-Martinez, Javier
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    Diaz Fortuny, Javier  
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    Saraza Canflanca, Pablo  
    ;
    Rodriguez, Rosana
    Proceedings paper
    2023, 61st IEEE International Reliability Physics Symposium (IRPS), MAR 26-30, 2023
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    CoSi2Si1-xGx-interfaces for Schottky barrier infrared detectors with extended detection regime

    Kolodinski, Sabine
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    Alves Donaton, Ricardo
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    Roca, Elisenda
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    Caymax, Matty  
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    Maex, Karen  
    Proceedings paper
    1995, Growth and Characterization of Materials for Infrared Detectors II, 13/07/1995, p.175-84
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    Electro-optical characterization of epitaxial and polycrystalline CoSi2 Schottky diodes

    Roca, Elisenda
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    Larsen, Kim Kyllesbech
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    Kolodinski, Sabine
    ;
    Mertens, Robert  
    Proceedings paper
    1995, Infrared Technology XXI; 9-13 July 1995; San Diego, CA, USA., p.465-61
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    Increase in the infrared response of silicide schottky barrier diodes by grain boundary scattering

    Roca, Elisenda
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    Kyllesbech Larsen, K.
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    Kolodinski, Sabine
    ;
    Mertens, Robert  
    Journal article
    1995, Appl. Phys. Lett., (67) 10, p.1372-1374
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    Influence of grain boundary scattering in the infrared response of silicide Schottky barrier diodes

    Roca, Elisenda
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    Larsen, Kim Kyllesbech
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    Kolodinski, Sabine
    ;
    Mertens, Robert  
    Journal article
    1996, Journal of Appl Physics, (79) 8, p.4426-4430
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    Infrared response of epitaxial and polycrystalline CoSi2 Schottky diodes

    Roca, Elisenda
    ;
    Larsen, Kim Kyllesbech
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    Kolodinski, Sabine
    ;
    Mertens, Robert  
    Journal article
    1998, Materials Science and Technology, (14) 12, p.1303-1306
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    Non-destructive characterization of the uniformity of thin cobalt disilicide films by Raman microprobe measurements

    Pérez-Rodríguez, A.
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    Roca, Elisenda
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    Jawhari, T.
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    Morante, J. R.
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    Schreutelkamp, Rob
    Journal article
    1994, Thin Solid Films, 251, p.45-50
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    Non-destructive thickness determination of thin cobalt and cobalt disilicide layers on silicon substrates

    Roca, Elisenda
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    Vanhellemont, Jan
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    Schreutelkamp, Rob
    ;
    Vermeiren, Jan
    Journal article
    1994, Thin Solid Films, 240, p.110-113
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    Statistical threshold voltage shifts caused by BTI and HCI at nominal and accelerated conditions

    Saraza-Canflanca, Pablo
    ;
    Rodriguez, Rosana
    ;
    Martin-Martinez, Javier
    ;
    Castro-Lopez, Rafael
    Journal article
    2021, SOLID-STATE ELECTRONICS, 185

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