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Statistical threshold voltage shifts caused by BTI and HCI at nominal and accelerated conditions
Publication:
Statistical threshold voltage shifts caused by BTI and HCI at nominal and accelerated conditions
Date
2021
Journal article
https://doi.org/10.1016/j.sse.2021.108037
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Saraza-Canflanca, Pablo
;
Rodriguez, Rosana
;
Martin-Martinez, Javier
;
Castro-Lopez, Rafael
;
Roca, Elisenda
;
V. Fernandez, Fancisco
;
Nafria, Montserrat
;
Diaz Fortuny, Javier
Journal
SOLID-STATE ELECTRONICS
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1971
since deposited on 2021-11-02
Acq. date: 2025-10-23
Citations
Metrics
Views
1971
since deposited on 2021-11-02
Acq. date: 2025-10-23
Citations