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Browsing by Author "Rodriguez, Rosanna"

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    Channel hot-carriers degradation in MOSFETs: A conductive AFM study at the nanoscale

    Bayerl, A.
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    Porti, Marc
    ;
    Martin-Martinez, Javier
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    Lanza, M.
    ;
    Rodriguez, Rosanna
    ;
    Velayudhan, V.
    Proceedings paper
    2013, IEEE International Reliability Physics Symposium - IRPS, 14/04/2013, p.5D4.1-5D4.6
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    Emerging yield and reliability challenges in nanometer CMOS technologies

    Gielen, Georges  
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    De Wit, Pieter J.H.
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    Maricau, Elie
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    Loeckx, J.
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    Martin-Martinez, Jose
    ;
    Kaczer, Ben  
    Proceedings paper
    2008, Design Automation and Test in Europe Conference - DATE, 10/03/2008, p.1322-1327
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    Negative bias temperature instability in devices with millisecond annealed ultra-shallow junctions

    Moras, Miquel
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    Martin-Martinez, Javier
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    Rodriguez, Rosanna
    ;
    Nafria, Montse
    ;
    Aymerich, Xavier
    Proceedings paper
    2013, International Semiconductor Device Research Symposium - ISDRS, 11/12/2013

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