Browsing by Author "Rogge, S."
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Publication Atomistic understanding of a single gated dopant atom in a MOSFET
;Lansbergen, G. ;Rahman, R. ;Wellard, C. ;Caro, J.; ; Klimeck, G.Proceedings paper2008, Materials and Devices for "Beyond CMOS" Scaling, 24/03/2008, p.1067-B03-07Publication Coherent transport through a double donor system in silicon
Journal article2010, Applied Physics Letters, (96) 7, p.72110Publication Direct observation by resonant tunneling of the B+ level in a delta-doped silicon barrier
Journal article2004, Physical Review B, (69) 12, p.125324-1-125324-5Publication Electric field reduced charging energies and two-electron bound excited states of single donors in silicon
Journal article2011, Physical Review B, (84) 11, p.115428Publication Electron transport properties of single donors in nanoscale Si MOSFETs
Proceedings paper2009, Silicon Nanoelectronics Workshop, 13/06/2009, p.135-136Publication From single-atom spectroscopy to lifetime enhanced triplet transport in MOSFETs
Proceedings paper2009, International Conference on Solid-State Devices and Materials - SSDM, 7/10/2009, p.258-259Publication Gate-induced quantum- confinement transition of a single dopant atom in a silicon FinFET
Journal article2008, Nature Physics, (4) 8, p.656-661Publication Innovative characterization techniques for ultra-scaled FinFETs
Proceedings paper2010, 10th IEEE International Conference on Nanotechnology and Joint Symposium with Nano Korea, 17/08/2010, p.25-30Publication Lifetime-enhanced transport in silicon due to spin and valley blockade
Journal article2011, Physical Review Letters, (107) 13, p.136602Publication Probing the spin states of a single acceptor atom
;van der Heijden, J. ;Salfi, J. ;Mol, J.A. ;Verduijn, J. ;Tettamanzi, G.C.Hamilton, A. R.Journal article2014, Nano Letters, (14) 3, p.1492-1496Publication Single-electron capacitance spectroscopy of individual dopants in silicon
Journal article2011-10, Nano Letters, (11) 12, p.5208-5212Publication Towards Tunneling Through a Single Dopant Atom
Proceedings paper2005, PHYSICS OF SEMICONDUCTORS: 27th International Conference on the Physics of Semiconductors - ICPS-27, 26/07/2004, p.1587Publication Transport-based dopant metrology in advanced FinFETs
Proceedings paper2008, Technical Digest International Electron Devices Meeting - IEDM, 15/12/2008, p.713-716