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Browsing by Author "Rogge, S."

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    Atomistic understanding of a single gated dopant atom in a MOSFET

    Lansbergen, G.
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    Rahman, R.
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    Wellard, C.
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    Caro, J.
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    Collaert, Nadine  
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    Biesemans, Serge  
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    Klimeck, G.
    Proceedings paper
    2008, Materials and Devices for "Beyond CMOS" Scaling, 24/03/2008, p.1067-B03-07
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    Coherent transport through a double donor system in silicon

    Verduijn, J.
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    Tettamanzi, G.
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    Lansbergen, G.P.
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    Collaert, Nadine  
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    Biesemans, Serge  
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    Rogge, S.
    Journal article
    2010, Applied Physics Letters, (96) 7, p.72110
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    Direct observation by resonant tunneling of the B+ level in a delta-doped silicon barrier

    Caro, J.
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    Vink, I.D.
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    Smit, G.D.J.
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    Rogge, S.
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    Klapwijk, T.M.
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    Loo, Roger  
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    Caymax, Matty  
    Journal article
    2004, Physical Review B, (69) 12, p.125324-1-125324-5
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    Electric field reduced charging energies and two-electron bound excited states of single donors in silicon

    Rahman, R.
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    Lansbergen, G.
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    Verduijn, J.
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    Tettamanzi, G.C.
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    Park, S.H.
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    Collaert, Nadine  
    Journal article
    2011, Physical Review B, (84) 11, p.115428
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    Electron transport properties of single donors in nanoscale Si MOSFETs

    Verduijn, J.
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    Lansbergen, G.
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    Tettamanzi, G.C.
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    Rahman, R.
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    Biesemans, Serge  
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    Collaert, Nadine  
    Proceedings paper
    2009, Silicon Nanoelectronics Workshop, 13/06/2009, p.135-136
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    From single-atom spectroscopy to lifetime enhanced triplet transport in MOSFETs

    Verduijn, J.
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    Lansbergen, G.P.
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    Tettamanzi, G.C.
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    Rahman, R.
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    Biesemans, Serge  
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    Collaert, Nadine  
    Proceedings paper
    2009, International Conference on Solid-State Devices and Materials - SSDM, 7/10/2009, p.258-259
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    Gate-induced quantum- confinement transition of a single dopant atom in a silicon FinFET

    Lansbergen, G.P.
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    Rahman, R.
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    Wellard, C.J.
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    Woo, I.
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    Caro, J.
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    Collaert, Nadine  
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    Biesemans, Serge  
    Journal article
    2008, Nature Physics, (4) 8, p.656-661
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    Innovative characterization techniques for ultra-scaled FinFETs

    Tettamanzi, G.C.
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    Lansbergen, G.P.
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    Verduijn, J.
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    Rahman, R.
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    Paul, A.
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    Lee, S.
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    Collaert, Nadine  
    Proceedings paper
    2010, 10th IEEE International Conference on Nanotechnology and Joint Symposium with Nano Korea, 17/08/2010, p.25-30
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    Lifetime-enhanced transport in silicon due to spin and valley blockade

    Lansbergen, G.P.
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    Rahman, R.
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    Verduijn, J.
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    Tettamanzi, G.C.
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    Collaert, Nadine  
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    Biesemans, Serge  
    Journal article
    2011, Physical Review Letters, (107) 13, p.136602
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    Probing the spin states of a single acceptor atom

    van der Heijden, J.
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    Salfi, J.
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    Mol, J.A.
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    Verduijn, J.
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    Tettamanzi, G.C.
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    Hamilton, A. R.
    Journal article
    2014, Nano Letters, (14) 3, p.1492-1496
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    Single-electron capacitance spectroscopy of individual dopants in silicon

    Gasseller, M.
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    DeNinno, M.
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    Loo, Roger  
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    Harrison, J.F
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    Caymax, Matty  
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    Rogge, S.
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    Tessmer, S.H.
    Journal article
    2011-10, Nano Letters, (11) 12, p.5208-5212
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    Towards Tunneling Through a Single Dopant Atom

    Caro, J.
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    Smit, G.D.J.
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    Sellier, H.
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    Loo, Roger  
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    Caymax, Matty  
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    Rogge, S.
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    Klapwijk, T.M.
    Proceedings paper
    2005, PHYSICS OF SEMICONDUCTORS: 27th International Conference on the Physics of Semiconductors - ICPS-27, 26/07/2004, p.1587
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    Transport-based dopant metrology in advanced FinFETs

    Lansbergen, G.P.
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    Rahman, R.
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    Wellard, C.J.
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    Caro, J.
    ;
    Collaert, Nadine  
    ;
    Biesemans, Serge  
    Proceedings paper
    2008, Technical Digest International Electron Devices Meeting - IEDM, 15/12/2008, p.713-716

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