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Browsing by Author "Rolain, Y."

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    A first step towards a wave-based 'stochastic' calibration for multi-port vectorial network analyzers

    Rolain, Y.
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    Van Moer, W.
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    DeGroot, D.
    Proceedings paper
    2004, 63rd ARFTG Conference Digest, 11/06/2004, p.151-156
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    An automatic harmonic selection scheme based on spectrum analyzer measurements

    Rabijns, Daan
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    Vandersteen, Gerd  
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    Rolain, Y.
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    Van Moer, W.
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    Geens, A.
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    Schoukens, J.
    Proceedings paper
    2002, 60th ARFTG conference digest, 5/12/2002, p.123-130
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    An automatic harmonic selection scheme based on spectrum analyzer measurements

    Rabijns, D.
    ;
    Vandersteen, Gerd  
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    Rolain, Y.
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    Van Moer, W.
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    Geens, A.
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    Schoukens, J.
    Meeting abstract
    2003, 22nd Benelux Meeting on Systems and Control, 19/03/2003
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    An automatic harmonic selection scheme for measurements and calibration with the nonlinear vectorial network analyzer

    Van Moer, W.
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    Rolain, Y.
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    Schoukens, J.
    Journal article
    2002, IEEE Trans. Instrumentation and Measurement, (51) 2, p.337-341
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    An identification technique for data acquisition characterization in the presence of nonlinear distortions and time base distortions

    Vandersteen, Gerd  
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    Rolain, Y.
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    Schoukens, J.
    Journal article
    2001, IEEE Trans. Instrumentation and Measurement, (50) 5, p.1355-1363
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    Block-oriented instrument software design

    Rolain, Y.
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    Van Moer, W.
    Journal article
    2004, IEEE Trans. Instrumentation and Measurement, (53) 3, p.830-838
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    Box-Jenkins alike identification using nonparametric noise models

    Schoukens, J.
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    Pintelon, R.
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    Rolain, Y.
    Journal article
    2004, Automatica, (40) 12, p.2083-2089
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    Broad-band measurement and identiication of a Wiener-Hammerstein model for an RF amplifier

    Crama, P.
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    Rolain, Y.
    Proceedings paper
    2002, 60th ARFTG Conference Digest, 5/12/2002, p.49-58
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    Broadband high frequency differential coupler

    Vandersteen, Gerd  
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    Barel, A.
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    Rolain, Y.
    Proceedings paper
    2001, IEEE Instrumentation and Measurement Technology Conference, 21/05/2001, p.1897-1902
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    Broadband high-frequency hybrid

    Vandersteen, Gerd  
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    Barel, A.
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    Rolain, Y.
    Journal article
    2002, IEEE Trans. Instrumentation and Measurement, (51) 6, p.1204-1209
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    Characterisation of multiport systems through 3-port LSNA measurements

    Van Moer, W.
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    Rolain, Y.
    Oral presentation
    2003, Workshop GAAS WS 3 "Advanced RF Characterization Techniques"
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    Characterization of substrate noise impact on RF CMOS integrated circuits in lightly doped substrates

    Soens, Charlotte  
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    Crunelle, Cathy
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    Wambacq, Piet  
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    Vandersteen, Gerd  
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    Donnay, Stephane  
    Proceedings paper
    2003, Proceedings of IMTC - The 20th IEEE Instrumentation and Measurement Technology Conference, 20/05/2003, p.1303-1308
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    Corrections for nonlinear vector network analyzer measurements using a stochastic multi-line/reflect method

    DeGroot, D.C.
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    Rolain, Y.
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    Pintelon, R.
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    Schoukens, J.
    Proceedings paper
    2004, IEEE MTT International Microwave Symposium Digest, 6/06/2004, p.1735-1738
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    Creating spectrally pure signals for ADC-testing

    Rabijns, D.
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    Vandersteen, Gerd  
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    Van Moer, W.
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    Rolain, Y.
    ;
    Schoukens, J.
    Proceedings paper
    2003, Proceedings of the 20th IEEE Instrumentation and Measurement Technology Conference - IMTC, 20/03/2003, p.614-618
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    Determining the reciprocity of mixers through 3-port LSNA measurements

    Van Moer, W.
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    Rolain, Y.
    Proceedings paper
    2003, 62nd ARFTG Conference Digest, 2/12/2003
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    Efficient bit-error-rate estimation of multicarrier tranceivers

    Vandersteen, Gerd  
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    Wambacq, P.
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    Rolain, Y.
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    Schoukens, J.
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    Donnay, Stephane  
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    Engels, Marc
    Proceedings paper
    2001, Design, Automation and Test in Europe, 2001. Conference and Exhibition 2001. Proceedings, 13/03/2001, p.164-168
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    Estimation and validation of semi-parametric dynamic nonlinear models

    Rolain, Y.
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    Van Moer, W.
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    Schoukens, J.
    Proceedings paper
    2003, 13th IFAC Symposium on System Identification, 27/08/2003, p.343-347
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    Experimental characterization of operational amplifiers: a system identification approach

    Pintelon, R.
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    Vandersteen, Gerd  
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    Rolain, Y.
    Proceedings paper
    2003, Proceedings of the 20th IEEE Instrumentation and Measurement Technology Conference - IMTC, 20/03/2003, p.362-367
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    Fast approximate identification of nonlinear systems

    Schoukens, J.
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    Nemeth, J.
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    Crama, P.
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    Rolain, Y.
    ;
    Pintelon, R.
    Proceedings paper
    2003, 13th IFAC Symposium on System Identification, 27/08/2003, p.61-66
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    Fast approximate identification of nonlinear systems

    Schoukens, J.
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    Nemeth, J.
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    Crama, P.
    ;
    Rolain, Y.
    ;
    Pintelon, R.
    Journal article
    2003, Automatica, (39) 7, p.1267-1274
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