Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
Characterization of substrate noise impact on RF CMOS integrated circuits in lightly doped substrates
Publication:
Characterization of substrate noise impact on RF CMOS integrated circuits in lightly doped substrates
Copy permalink
Date
2003
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Soens, Charlotte
;
Crunelle, Cathy
;
Wambacq, Piet
;
Vandersteen, Gerd
;
Donnay, Stephane
;
Rolain, Y.
;
Kuijk, Maarten
;
Barel, A.
Journal
Abstract
Description
Metrics
Views
1914
since deposited on 2021-10-15
2
last month
Acq. date: 2025-12-10
Citations
Metrics
Views
1914
since deposited on 2021-10-15
2
last month
Acq. date: 2025-12-10
Citations