Publication:

Characterization of substrate noise impact on RF CMOS integrated circuits in lightly doped substrates

Date

2003
Proceedings Paper
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dc.contributor.authorSoens, Charlotte
dc.contributor.authorCrunelle, Cathy
dc.contributor.authorWambacq, Piet
dc.contributor.authorVandersteen, Gerd
dc.contributor.authorDonnay, Stephane
dc.contributor.authorRolain, Y.
dc.contributor.authorKuijk, Maarten
dc.contributor.authorBarel, A.
dc.contributor.imecauthorSoens, Charlotte
dc.contributor.imecauthorWambacq, Piet
dc.contributor.imecauthorVandersteen, Gerd
dc.contributor.imecauthorDonnay, Stephane
dc.contributor.orcidimecWambacq, Piet::0000-0003-4388-7257
dc.contributor.orcidimecDonnay, Stephane::0000-0003-2489-4793
dc.date.accessioned2021-10-15T06:44:16Z
dc.date.available2021-10-15T06:44:16Z
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8159
dc.source.beginpage1303
dc.source.conferenceProceedings of IMTC - The 20th IEEE Instrumentation and Measurement Technology Conference
dc.source.conferencedate20/05/2003
dc.source.conferencelocationVail, CO USA
dc.source.endpage1308
dc.title

Characterization of substrate noise impact on RF CMOS integrated circuits in lightly doped substrates

dc.typeProceedings paper
dspace.entity.typePublication
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