Browsing by Author "Rott, Karina"

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Experimental characterization of BTI defects

Kaczer, Ben
;
Afanasiev, Valeri
;
Rott, Karina
;
Cerbu, F.
;
Franco, Jacopo
;
Grasser, Tibor
;
Madia, O.
Proceedings paper
2013, SISPAD Satellite Workshop: Modelling of Reliability and Degradation of Nanoelectronic Devices, 3/09/2013, p.444-450
Extraction of the lateral position of border traps in nanoscale MOSFETs

Illarionov, Yury
;
Bina, Markus
;
Tyaginov, Stanislav
;
Rott, Karina
;
Kaczer, Ben
;
Reisinger, Hans
Journal article
2015, IEEE Transactions on Electron Devices, (62) 9, p.2730-2737
On the microscopic origin of the frequency dependence of hole trapping in pMOSFETs

Grasser, Tibor
;
Reisinger, Hans
;
Rott, Karina
;
Toledano Luque, Maria
;
Kaczer, Ben
Proceedings paper
2012-12, International Electron Devices Meeting - IEDM, 10/12/2012, p.19.6