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Browsing by Author "Royere, Gael"

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    Dummy gate amorphous silicon CMP using in-situ profile CLC endpoint system for advanced FinFET

    Tsvetanova, Diana  
    ;
    Iizumi, Takeshi
    ;
    Ito, Ban
    ;
    Royere, Gael
    ;
    Durix, Fabien
    ;
    Devriendt, Katia  
    Proceedings paper
    2017, International Conference on. Planarization/CMP Technology - ICPT, 11/10/2017, p.307-311
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    The impact of the pad surface temperature control on W CMP performance

    Royere, Gael
    ;
    Teugels, Lieve  
    ;
    Ito, Ban
    ;
    Iizumi, Takeshi
    ;
    Durix, Fabien
    ;
    Devriendt, Katia  
    Proceedings paper
    2018-10, International Conference on Planarization CMP Technology - ICPT, 14/10/2018, p.C6

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