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Browsing by Author "Rubin, Leonard"

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    Influence of the process sequence and termal budget on the strain of SiC stressor layers formed by ion implantation

    Rosseel, Erik  
    ;
    Ortolland, Claude
    ;
    Hikavyy, Andriy  
    ;
    Schram, Tom  
    ;
    Falepin, Annelies  
    Proceedings paper
    2010, 18th IEEE International Conference on Advanced Thermal Processing of Semiconductors - RTP, 29/09/2010, p.32-40
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    Influence of the process sequence and termal budget on the straion fof SiC stressor layers formed by Ion Implantation

    Rosseel, Erik  
    ;
    Ortolland, Claude
    ;
    Hikavyy, Andriy  
    ;
    Schram, Tom  
    ;
    Falepin, Annelies  
    Meeting abstract
    2010-10, 18th IEEE International Conference on Advanced Thermal Processing of Semiconductors - RTP, 29/09/2010

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