Browsing by Author "Saraswat, K. C."
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Publication Influence of process-induced stress on device characteristics and its impact on scaled device performance
Journal article1999, IEEE Trans. Electron Devices, (46) 6, p.1245-1252Publication The influence of oxidation-induced stress on the generation current and its impact on scaled device performance
Proceedings paper1996, International Electron Devices Meeting. Technical Digest - IEDM, 8/12/1996, p.709-12Publication Towards high mobility GeSn channel nMOSFETs: improved surface passivation using novel ozone oxidation method
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