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The influence of oxidation-induced stress on the generation current and its impact on scaled device performance
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The influence of oxidation-induced stress on the generation current and its impact on scaled device performance
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Date
1996
Proceedings Paper
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1474.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Smeys, Peter
;
Griffin, P. B.
;
Rek, Z. U.
;
De Wolf, Ingrid
;
Saraswat, K. C.
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Abstract
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1863
since deposited on 2021-09-29
Acq. date: 2025-12-09
Citations
Metrics
Views
1863
since deposited on 2021-09-29
Acq. date: 2025-12-09
Citations