Browsing by Author "Schleich, Christian"
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Publication Comphy v3.0-A compact-physics framework for modeling charge trapping related reliability phenomena in MOS devices
Journal article2023, MICROELECTRONICS RELIABILITY, (146) July, p.Art. 115004Publication Modeling the Hysteresis of Current-Voltage Characteristics in 4H-SiC Transistors
Proceedings paper2020, IEEE International Integrated Reliability Workshop (IIRW), OCT 04-NOV 01, 2020, p.31-34Publication Physical modeling of bias temperature instabilities in SiC MOSFETs
Publication Single-Versus Multi-Step Trap Assisted Tunneling Currents-Part II: The Role of Polarons
Publication TCAD Modeling of Temperature Activation of the Hysteresis Characteristics of Lateral 4H-SiC MOSFETs
Journal article2022-04-19, IEEE TRANSACTIONS ON ELECTRON DEVICES, (69) 6, p.3290-3295