Browsing by Author "Schmidt, Michael"
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Publication Clustered single wafer wet cleaning
; ; ; ; ;Fyen, Wim ;Lauerhaas, JeffXu, KaidongMeeting abstract2002, 201st Meeting of the Electrochemical Society. Rapid Thermal and Other Short Time Processing Technologies III, 12/05/2002, p.699Publication Correlation between barrier integrity and TDDB performance of copper porous low-k interconnects
Journal article2004, Microelectronic Engineering, (76) 1_4, p.70-75Publication Recent advances in wafer cleaning
; ; ;Bearda, Twan ;Maes, Marjan ;Lauerhaas, Jeff ;Loewenstein, LeeFyen, WimProceedings paper2001, Proceedings SEMI Front End Technology Conference, 24/04/2001Publication Resist strip and Cu diffusion barrier etch in Cu BEOL integration schemes in a Mattson Highlands chamber
Oral presentation2002, UCPSS - Ultra Clean Processing Technology Symposium