Browsing by Author "Schoenmaker, Wim"
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Publication A comparison between various empirical models for TCAD purposes
Proceedings paper2000, Proceedings of the 23rd International Semiconductor Conference - CAS, 10/10/2000, p.315-318Publication A hybrid technique for TCAD modeling and optimization
Proceedings paper1998, Simulation of Semiconductor Processes and Devices 1998 - SISPAD 98, 2/09/1998, p.73-76Publication A hybrid technique for TCAD modeling and optimization
Journal article2000, Journal Transactions on CADPublication A method for smooth statistical interpolation
Schoenmaker, WimProceedings paper1999, Proceedings CSCS Conference; 25-29 May 1999; Bucharest, Romania., p.101Publication A new finite-element discretization technique for the hydrodynamic formulation of energy balance equations
Journal article1994, COMPEL: The International Journal for Computation and Mathematics in Electrical and Electronic Engineering, (13) 3, p.531-551Publication A novel model for boron diffusion in SiGe strained layers based on a kinetic driven Ge-B pairing mechanism
;Villaneuva, D. ;Moens, P. ;Krishnasamy, RajendranSchoenmaker, WimProceedings paper2001, Proceedings of the International Conference on Simulation of Semiconductor Physics and Processes - SISPAD; 5-7 September 2001; A, p.22-25Publication A simple model and simulation of complete suppression of boron out-diffusion in Si1-xGex by carbon insertion
;Krishnasamy, RajendranSchoenmaker, WimProceedings paper2001, Proceedings of the International Conference on Simulation of Semiconductor Physics and Processes - SISPAD; 5-7 September 2001; A, p.66-69Publication Ab-initio calculation of substrate currents using ghost field gauging
Oral presentation2002, Scientific Computing in Electrical Engineering - SCEEPublication Ab-initio electrodynamic modeling of on-chip back-end structures
;Schoenmaker, Wim ;Meuris, PeterMagnus, P.Proceedings paper2001, Proceedings of the International Conference on Simulation of Semiconductor Physics and Processes - SISPAD; 5-7 September 2001; A, p.98-107Publication Balance equation approach towards quantum transport
Meeting abstract2003, Annual APS March Meeting, 3/03/2003, p.98Publication Conductance quantization : where is the dissipation
Oral presentation2003, Second Euroconference on Quantum Optoelectronics for NanotechnologyPublication Conductance quantization and dissipation
Journal article2003, Physics Letters A, (310) 4, p.322-328Publication Conductance quantization: where is the dissipation?
Oral presentation2003, 2nd Euroconference on Quantum Optoelectronics for Nanotechnology - EQUONT2Publication Control and readout of current-induced magnetic flux quantization in a superconducting transformer
Journal article2009, Superconductor Science and Technology Journal, (22) 2, p.25001Publication Device modeling in the frame of project ADEQUAT
;Rudan, M. ;Vecchi, M. C. ;Von Schwerin, Andreas ;Schoenmaker, Wim; McCarthy, K.Journal article1996, Microelectronic Engineering, 34, p.67-84Publication Distribution of fields and charge carriers in cylindrical and planar nanosize structures
Oral presentation1998, 1998 March Meeting of the American Physical Society; 16-20 March 1998; Los Angeles, CA, USA.Publication Distribution of fields and charge carriers in cylindrical nanosize silicon-based metal-oxide-semiconductor structures
;Pokatilov, E. P. ;Fomin, V. M. ;Balaban, S. N. ;Gladilin, V. N. ;Klimin, S. N.Devreese, J. T.Journal article1999, J. Appl. Phys., (85) 9, p.6625-6631Publication Early resistance change and stress/electromigration modeling in aluminum interconnects
;Petrescu, Violeta ;Mouthaan, A. J.Schoenmaker, WimProceedings paper1997, Proceedings of 8th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - ESREF 97; October 1997., p.1491-1494Publication Early resistance change and stress/electromigration modeling in aluminum interconnects
;Petrescu, Violeta ;Mouthaan, A. J.Schoenmaker, WimJournal article1997, Microelectronics and Reliability, (37) 10_11, p.1491-1494