Browsing by Author "Schubert, J."
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Publication Band alignment between (100)Si and complex rare earth/transition metal oxides
Journal article2004, Applied Physics Letters, (85) 24, p.5917-5919Publication Capacitivity coupled electrolyte-conductivity sensor based on high-k materials of barium strontium titanate
;Huck, Christina ;Poghossian, A. ;Bäcker, M. ;Chaudhuri, S. ;Zander, W. ;Schubert, J.Begoyan, V.K.Journal article2014, Sensors and Actuators B: Chemical, 198, p.102-109Publication Preparation and characterization of rare earth scandates as alternative gate oxide materials
;Wagner, M. ;Heeg, T. ;Schubert, J. ;Zhao, Chao; ; Proceedings paper2005, 6th European Conference on Ultimate Integration of Silicon - ULIS, 7/04/2005Publication Rare-earth metal scandate high-k layers: promises and problems
Meeting abstract2005, Meeting Abstracts 208th Electrochemical Society Meeting: 3rd International Symposium on High Dielectric Constant Gate Stacks, 16/10/2005Publication Reduction of silicon dioxide interfacial layer to 4.6 Å EOT by Al remote scavenging in high-j/metal gate stacks on Si
Journal article2013, Microelectronic Engineering, 109, p.103-112Publication Ternary rare-earth metal oxide high-k layers on silicon oxide
;Zhao, Chao; ;Brijs, Bert; ; ; Heeg, T.Journal article2005-03, Applied Physics Letters, (86) 13, p.132903-1-132903-3