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Browsing by Author "Schubert, J."

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    Band alignment between (100)Si and complex rare earth/transition metal oxides

    Afanasiev, Valeri  
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    Stesmans, Andre  
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    Zhao, Chao
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    Caymax, Matty  
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    Heeg, T.
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    Schubert, J.
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    Jia, Y.
    Journal article
    2004, Applied Physics Letters, (85) 24, p.5917-5919
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    Capacitivity coupled electrolyte-conductivity sensor based on high-k materials of barium strontium titanate

    Huck, Christina
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    Poghossian, A.
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    Bäcker, M.
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    Chaudhuri, S.
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    Zander, W.
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    Schubert, J.
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    Begoyan, V.K.
    Journal article
    2014, Sensors and Actuators B: Chemical, 198, p.102-109
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    Preparation and characterization of rare earth scandates as alternative gate oxide materials

    Wagner, M.
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    Heeg, T.
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    Schubert, J.
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    Zhao, Chao
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    Richard, Olivier  
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    Caymax, Matty  
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    Afanasiev, Valeri  
    Proceedings paper
    2005, 6th European Conference on Ultimate Integration of Silicon - ULIS, 7/04/2005
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    Rare-earth metal scandate high-k layers: promises and problems

    Zhao, Chao
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    Heeg, T.
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    Wagner, M.
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    Schubert, J.
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    Witters, Thomas  
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    Brijs, Bert
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    Bender, Hugo  
    Meeting abstract
    2005, Meeting Abstracts 208th Electrochemical Society Meeting: 3rd International Symposium on High Dielectric Constant Gate Stacks, 16/10/2005
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    Reduction of silicon dioxide interfacial layer to 4.6 Å EOT by Al remote scavenging in high-j/metal gate stacks on Si

    Nichau, Alexander
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    Schafer, A.
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    Knoll, L.
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    Wirths, S.
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    Schram, Tom  
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    Ragnarsson, Lars-Ake  
    Journal article
    2013, Microelectronic Engineering, 109, p.103-112
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    Ternary rare-earth metal oxide high-k layers on silicon oxide

    Zhao, Chao
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    Witters, Thomas  
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    Brijs, Bert
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    Bender, Hugo  
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    Richard, Olivier  
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    Caymax, Matty  
    ;
    Heeg, T.
    Journal article
    2005-03, Applied Physics Letters, (86) 13, p.132903-1-132903-3

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