Browsing by Author "Sercu, S."

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Measurements of millimeter wave test structures for high speed chip testing

De Keulenaer, Timothy
;
Ban, Yu
;
Torfs, Guy
;
Sercu, S.
;
De Geest, Jan
;
Bauwelinck, Johan
Proceedings paper
2014, 18th IEEE Workshop on Signal and Power Integrity - SPI, 11/05/2014, p.1-4
Modelling complex via hole structures

Laermans, E.
;
De Geest, J.
;
De Zutter, Daniel
;
Olyslager, Frank
;
Sercu, S.
;
Morlion, D.
Journal article
2002, IEEE Trans. Advanced Packaging, (25) 2, p.206-214