Browsing by Author "Shimada, Yohei"
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Publication Calibration and modeling of LICCDM setups
Meeting abstract2021, International Electrostatic Discharge Workshop - IEW, 15/05/2021Publication FI-CDM and LICCDM testing on wafer, single die and package levels
Proceedings paper2024, 46th Annual Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2024, p.1Publication Low-impedance Contact CDM – Evaluation and Modeling
Proceedings paper2019, 2019 41st Annual EOS/ESD Symposium (EOS/ESD), 15/09/2019, p.1Publication Optimization of wafer-level low-impedance contact CDM testers
Proceedings paper2020, EOS/ESD Symposium, 13/09/2020Publication Wafer-Level LICCDM Device Testing
Proceedings paper2021, 43rd Annual EOS/ESD Symposium (EOS/ESD), 2021-NaN