Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
Optimization of wafer-level low-impedance contact CDM testers
Publication:
Optimization of wafer-level low-impedance contact CDM testers
Copy permalink
Date
2020-11
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simicic, Marko
;
Wu, Wei-Min
;
Jack, Nathan
;
Tamura, Shinichi
;
Shimada, Yohei
;
Sawada, Masanori
;
Chen, Shih-Hung
Journal
Abstract
Description
Metrics
Views
2013
since deposited on 2021-10-29
Acq. date: 2025-12-15
Citations
Metrics
Views
2013
since deposited on 2021-10-29
Acq. date: 2025-12-15
Citations