Browsing by Author "Spiewak, P."
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Publication A comparison of intrinsic point defect properties in Si and Ge
Proceedings paper2008, Doping Engineering for Front-End Processing, 24/03/2008, p.1070-E6-05Publication On the characterisation of grown-in defects in Czocharski-grown Si and Ge
Journal article2008, Journal of Materials Science: Materials in Electronics, (19) Suppl.1, p.S24-S31