Browsing by Author "Stevens, G."
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Publication A wet chemical method for the determination of thickness of SiO2 layers below the nanometer level
; ; ; Journal article1999, J. Electrochem. Soc., (146) 5, p.1873-1878Publication Determination of th Pd content in Pd-doped SnO2 films
Publication The etching mechanisms of SiO2 in hydrofluoric acid
Journal article1994, Journal of the Electrochemical Society, (141) 10, p.2852-2857