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Browsing by Author "Stocco, Antonio"

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    Degradation mechanisms in AlGaN/GaN HEMTs submitted to off and on-state stress conditions

    Zanoni, Enrico
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    Meneghini, Matteo
    ;
    Stocco, Antonio
    ;
    Marcon, Denis  
    ;
    Bertin, Marco
    Proceedings paper
    2012, 6th Space Agency - MOD Workshop on Wideband Gap Semiconductors and Components, 8/10/2012
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    Degradation of AlGaN/GaN HEMTs below the "critical voltage": a time-dependent analysis

    Meneghini, Matteo
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    Stocco, Antonio
    ;
    Bertin, M
    ;
    Marcon, Denis  
    ;
    Meneghesso, Gaudenzio
    Proceedings paper
    2012, International Conference on Compound Semiconductor Manufacturing Technology - CSMantech, 23/04/2012
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    Degradation of AlGaN/GaN Schottky diodes on silicon: Role of defects at the AlGaNGaN interface

    Meneghini, Matteo
    ;
    Bertin, Marco
    ;
    Stocco, Antonio
    ;
    dal Santo, Gabriele
    ;
    Marcon, Denis  
    Journal article
    2013, Applied Physics Letters, (102) 16, p.163501
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    Electroluminescence analysis of time-dependent reverse-bias degradation of HEMTs: a complete model

    Meneghini, Matteo
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    Stocco, Antonio
    ;
    Bertini, Marco
    ;
    Ronchi, Nicolò
    ;
    Chini, Alessandro
    Proceedings paper
    2011, IEEE International Electron Devices Meeting - IEDM, 5/12/2011, p.469-472
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    Study of time-dependent degradation of reverse biased AlGaN/GaN HEMTs

    Stocco, Antonio
    ;
    Meneghini, Matteo
    ;
    Bertin,
    ;
    Marcon, Denis  
    ;
    Meneghesso, Gaudenzio
    Meeting abstract
    2012, Workshop on Compound Semiconductor Devices and Integrated Circuits - WOCSDICE, 28/05/2012
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    Time-dependent degradation of AlGaN/GaN high electron mobility transistors under reverse bias

    Mengehini, Matteo
    ;
    Stocco, Antonio
    ;
    Bertin, Marcon
    ;
    Marcon, Denis  
    ;
    Chini, Alessandro
    Journal article
    2012-01, Applied Physics Letters, (100) 3, p.33505

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