Browsing by Author "Stocco, Antonio"
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Publication Degradation mechanisms in AlGaN/GaN HEMTs submitted to off and on-state stress conditions
Proceedings paper2012, 6th Space Agency - MOD Workshop on Wideband Gap Semiconductors and Components, 8/10/2012Publication Degradation of AlGaN/GaN HEMTs below the "critical voltage": a time-dependent analysis
Proceedings paper2012, International Conference on Compound Semiconductor Manufacturing Technology - CSMantech, 23/04/2012Publication Degradation of AlGaN/GaN Schottky diodes on silicon: Role of defects at the AlGaNGaN interface
Journal article2013, Applied Physics Letters, (102) 16, p.163501Publication Electroluminescence analysis of time-dependent reverse-bias degradation of HEMTs: a complete model
;Meneghini, Matteo ;Stocco, Antonio ;Bertini, Marco ;Ronchi, NicolòChini, AlessandroProceedings paper2011, IEEE International Electron Devices Meeting - IEDM, 5/12/2011, p.469-472Publication Study of time-dependent degradation of reverse biased AlGaN/GaN HEMTs
Meeting abstract2012, Workshop on Compound Semiconductor Devices and Integrated Circuits - WOCSDICE, 28/05/2012Publication Time-dependent degradation of AlGaN/GaN high electron mobility transistors under reverse bias
Journal article2012-01, Applied Physics Letters, (100) 3, p.33505