Publication:

Degradation of AlGaN/GaN Schottky diodes on silicon: Role of defects at the AlGaNGaN interface

Date

2013

Journal article

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Author(s)

Meneghini, Matteo

;

;

Stocco, Antonio

;

dal Santo, Gabriele

;

;

Malinowski, Pawel

;

Chini, Alessandro

;

Meneghesso, Gaudenzio

;

Journal

Applied Physics Letters

Statistics

1948 since deposited on 2021-10-21

Acq. date: 2026-09-11