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Browsing by Author "Sunaga, H."

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    Degradation and recovery of 1.3μm InGaAsP laser diodes irradiated by 1-MeV fast neutrons

    Ohyama, Hidenori
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    Simoen, Eddy  
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    Claeys, Cor
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    Takami, Y.
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    Kudou, T.
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    Yoneoka, M.
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    Sunaga, H.
    Oral presentation
    1999, IEEE Nuclear and Space Radiation Effects Conference - NSREC 99
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    Degradation and recovery of AlGaAs/GaAs p-HEMT irradiated by high-energy particle

    Ohyama, Hidenori
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    Simoen, Eddy  
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    Kuroda, S.
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    Claeys, C.
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    Takami, Y.
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    Hakata, T.
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    Kobayashi, K.
    Journal article
    2001, Microelectronics Reliability, (41) 1, p.79-85
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    Degradation and recovery of alpha ray irradiated MOSFETs on SIMOX

    Ohyama, Hidenori
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    Simoen, Eddy  
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    Claeys, Cor
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    Takami, Y.
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    Kawamura, K.
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    Hakata, T.
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    Sunaga, H.
    Proceedings paper
    1997, Proceedings of the 8th International Symposium on Silicon-on-Insulator Technology and Devices, 31/08/1997, p.289-295
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    Degradation and recovery of In0.53Ga0.47As photodiodes by 1-MeV fast neutrons

    Ohyama, Hidenori
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    Vanhellemont, Jan
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    Takami, Y.
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    Hayama, Kiyoteru
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    Kudou, T.
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    Hakata, T.
    Journal article
    1996, IEEE Transactions on Nuclear Devices, (43) 6, pt.1, p.3019-26
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    Degradation and recovery of proton irradiated Si1-xGe x epitaxial devices

    Ohyama, Hidenori
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    Vanhellemont, Jan
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    Takami, Y.
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    Hayama, Kiyoteru
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    Sunaga, H.
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    Nashiyama, I.
    Journal article
    1996, IEEE Transactions on Nuclear Devices, (43) 6, pt.1, p.3089-96
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    Degradation and recovery of Si diodes by 20-MEV protons and 220-MEV carbon particles

    Ohyama, Hidenori
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    Hakata, T.
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    Simoen, Eddy  
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    Claeys, C.
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    Sunaga, H.
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    Hososhima, M.
    Proceedings paper
    1998, Semiconductors for Room-Temperature Radiation Detector Applications II;, p.435-440
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    Degradation and recovery of Si1-xGex devices after proton irradiation

    Ohyama, Hidenori
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    Vanhellemont, Jan
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    Takami, Y.
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    Hayama, Kiyoteru
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    Sunaga, H.
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    Nashiyama, I.
    Oral presentation
    1996, Materials Research Society Spring Meeting. Symposium F on GeSi and Related Compounds; April 9-11, 1996; San Francisco, Calif., U
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    Degradation and recovery of Si1-xGex devices by irradiation

    Ohyama, Hidenori
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    Vanhellemont, Jan
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    Takami, Y.
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    Hayama, Kiyoteru
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    Kudo, T.
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    Hakata, T.
    Proceedings paper
    1995, Strained Layer Epitaxy - Materials, Processing and Device Applications, 17/04/1995, p.365-371
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    Degradation of InGaAs pin photodiodes by neutron irradiation

    Ohyama, Hidenori
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    Vanhellemont, Jan
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    Takami, Y.
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    Hayama, Kiyoteru
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    Kudou, T.
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    Kohiki, S.
    Journal article
    1996, Semiconductor Science and Technology, (11) 10, p.1461-1463
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    Degradation of MOSFETs on SIMOX by irradiation

    Hakata, T.
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    Ohyama, Hidenori
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    Simoen, Eddy  
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    Claeys, C.
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    Vanhellemont, Jan
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    Takami, Y.
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    Sunaga, H.
    Oral presentation
    1997, APSORC '97; October 6-9 , 1997; Kunamoto, Japan.
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    Degradation of Si1-xGex epitaxial heterojunction bipolar transistors by 1-MeV fast neutrons

    Ohyama, Hidenori
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    Vanhellemont, Jan
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    Takami, Y.
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    Hayama, Kiyoteru
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    Sunaga, H.
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    Poortmans, Jef  
    Journal article
    1995, IEEE Trans. Nuclear Science, (42) 6, pt.1, p.1550-1557
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    Degradation of Si1-xGex epitxial devices by proton irradiation

    Ohyama, Hidenori
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    Hayama, Kiyoteru
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    Vanhellemont, Jan
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    Poortmans, Jef  
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    Caymax, Matty  
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    Takami, Y.
    Journal article
    1996, Applied Physics Letters, (69) 16, p.2429-31
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    Degradation of SiGe devices by proton irradiation

    Ohyama, Hidenori
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    Vanhellemont, Jan
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    Takami, Y.
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    Sunaga, H.
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    Nashiyama, I.
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    Uwatoko, Y.
    Journal article
    1997, Radiation Physics and Chemistry, (50) 4, p.341-346
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    Degradation of SiGe devices by proton irradiation

    Ohyama, Hidenori
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    Vanhellemont, Jan
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    Takami, Y.
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    Hayama, Kiyoteru
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    Sunaga, H.
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    Nahsiyama, I.
    Proceedings paper
    1997, Recent Progress in Accelerator Beam Application. Proceedings of the 7th International Symposium on Advanced Nuclear Energy Resea, 18/03/1996, p.212-217
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    Effect of radiation source on the degradation in irradiated Si1-xGex epitaxial devices

    Ohyama, Hidenori
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    Vanhellemont, Jan
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    Takami, Y.
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    Hayama, Kiyoteru
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    Sunaga, H.
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    Poortmans, Jef  
    Journal article
    1996, Phys. Stat. Sol. A, (155) 1, p.147-55
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    Factors determining the damage coefficients and the low-frequency noise in MeV proton irradiated silicon diodes

    Simoen, Eddy  
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    Claeys, C.
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    Ohyama, Hidenori
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    Takami, Y.
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    Sunaga, H.
    Oral presentation
    1997, APSORC '97; OCtober 6-9 , 1997; Kunamoto, Japan.
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    Factors determining the lifetime damage coefficients and the low-frequency noise in MeV proton irradiated silicon diodes

    Simoen, Eddy  
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    Claeys, Cor
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    Ohyama, Hidenori
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    Takami, Y.
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    Sunaga, H.
    Journal article
    1999, Journal of Radioanalytical and Nuclear Chemistry, (239) 1, p.207-211
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    Germanium Content Dependence of Radiation Damage in Electron-Irradiated Strained Si1-xGex Epitaxial Devices

    Ohyama, Hidenori
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    Vanhellemont, Jan
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    Sunaga, H.
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    Poortmans, Jef  
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    Caymax, Matty  
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    Clauws, P.
    Journal article
    1994, IEEE Transactions on Nuclear Science, (41) 6, p.2437-2442
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    High energy proton irradiation effects on the electrical performance of silicon

    Simoen, Eddy  
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    Vanhellemont, Jan
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    Alaerts, André
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    Claeys, Cor
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    Ohyama, Hidenori
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    Sunaga, H.
    Meeting abstract
    1996, Belgische natuurkundige vereniging. Algemene wetenschappelijke vergadering, 6/06/1996, p.CM-P-35
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    High-energy particle irradiation effects in 0.5µm BICMOS polysilicon emitter bipolar junction transistors

    Simoen, Eddy  
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    Decoutere, Stefaan  
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    Merron, B.
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    Deferm, Ludo  
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    Claeys, Cor
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    Berger, G.
    ;
    Ryckewaert, G.
    Proceedings paper
    1998, Proceedings of the 4th European Conference on Radiation and its Effects on Components and Systems - RADECS '97, 15/09/1997, p.102-107
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