Degradation and recovery of proton irradiated Si1-xGe x epitaxial devices

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Author(s)

Ohyama, Hidenori

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Vanhellemont, Jan

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Hayama, Kiyoteru

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Journal

IEEE Transactions on Nuclear Devices

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1954 since deposited on 2021-09-29

1last month

Acq. date: 2025-12-09