Publication:

Degradation and recovery of proton irradiated Si1-xGe x epitaxial devices

Date

1996
Journal article
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dc.contributor.authorOhyama, Hidenori
dc.contributor.authorVanhellemont, Jan
dc.contributor.authorTakami, Y.
dc.contributor.authorHayama, Kiyoteru
dc.contributor.authorSunaga, H.
dc.contributor.authorNashiyama, I.
dc.contributor.authorUwatoko, Y.
dc.contributor.authorPoortmans, Jef
dc.contributor.authorCaymax, Matty
dc.contributor.imecauthorPoortmans, Jef
dc.contributor.imecauthorCaymax, Matty
dc.contributor.orcidimecPoortmans, Jef::0000-0003-2077-2545
dc.date.accessioned2021-09-29T15:15:11Z
dc.date.available2021-09-29T15:15:11Z
dc.date.embargo9999-12-31
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1386
dc.source.beginpage3089
dc.source.endpage96
dc.source.issue6, pt.1
dc.source.journalIEEE Transactions on Nuclear Devices
dc.source.volume43
dc.title

Degradation and recovery of proton irradiated Si1-xGe x epitaxial devices

dc.typeJournal article
dspace.entity.typePublication
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