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Browsing by Author "Takizawa, H."

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    20-MeV alpha ray effects in AlGaAsP p-HEMTs

    Ohyama, Hidenori
    ;
    Simoen, Eddy  
    ;
    Claeys, Cor
    ;
    Takami, Y.
    ;
    Kobayashi, K.
    ;
    Yoneoka, M.
    Proceedings paper
    2000, Proceedings of the 4th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications, 11/10/2000, p.133-138
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    Electron-irradiation effects of CMOS integrated circuits with leakage current compensation

    Hayama, Kiyoteru
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    Ohyama, Hidenori
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    Simoen, Eddy  
    ;
    Claeys, Cor
    ;
    Takizawa, H.
    Proceedings paper
    2000, Proceedings of the RADECS Workshop - Les Actes des Journees Techniques du RADECS, 11/09/2000, p.168-171
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    High-energy boron-implantation and proton-irradiation effects in diodes with shallow trench isolation

    Poyai, Amporn
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    Simoen, Eddy  
    ;
    Claeys, Cor
    ;
    Hayama, Kiyoteru
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    Kobayashi, K.
    ;
    Ohyama, Hidenori
    Proceedings paper
    2000, Proceedings 2nd ENDEASD Workshop, 27/06/2000, p.193-203
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    Influence of boron implantation dose on the mechanical stress in polycrystalline silicon films

    Nakabayashi, M.
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    Ikegami, M.
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    Ohyama, Hidenori
    ;
    Kobauashi, K.
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    Yoneoka, M.
    ;
    Simoen, Eddy  
    Proceedings paper
    2000, 3rd International Conference Materials for Microelectronics, 16/10/2000, p.85-88
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    Influence of mechanical stress on the electrical performance of polycrystalline-silicon resistors

    Nakabayashi, M.
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    Ohyama, Hidenori
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    Kobayashi, K.
    ;
    Yoneoka, M.
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    Simoen, Eddy  
    ;
    Claeys, C.
    ;
    Takami, Y.
    Oral presentation
    2000, MRS Spring Meeting 2000. Symposium A:Amorphous and Heterogeneous Silicon Thin Films - 2000; 24-28 April 2000; San Francisco, Ca,
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    Radiation damage of n-MOSFETs fabricated in a BiCMOS process

    Ohyama, Hidenori
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    Kobayashi, K.
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    Nakabayashi, M.
    ;
    Simoen, Eddy  
    ;
    Claeys, Cor
    ;
    Takami, Y.
    Proceedings paper
    2000, 3rd International Conference Materials for Microelectronics, 16/10/2000, p.107-110
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    Radiation damage of N-MOSFETS fabricated in a BiCMOS process

    Kobayashi, K.
    ;
    Ohyama, Hidenori
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    Yoneoka, M.
    ;
    Hayama, Kiyoteru
    ;
    Nakabayashi, M.
    ;
    Simoen, Eddy  
    Journal article
    2001, Journal of Materials Science: Materials in Electronics, (12) 4_6, p.227-230
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    Radiation source dependence of degradation in shallow trench isolation diodes

    Hayama, Kiyoteru
    ;
    Ohyama, Hidenori
    ;
    Kobayasi, K.
    ;
    Poyai, Amporn
    ;
    Simoen, Eddy  
    ;
    Claeys, Cor
    Proceedings paper
    2000, Proceedings of the RADECS Workshop - Les Actes des Journees Techniques du RADECS, 11/09/2000, p.32-35

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