Browsing by Author "Tallarico, Andrea N."
Now showing 1 - 2 of 2
- Results per page
- Sort Options
Publication Impact of the substrate orientation on CHC reliability in n-FinFETs – separation of the various contributions
Journal article2014, IEEE Transactions on Device and Materials Reliability, (14) 1, p.52-56Publication Reliability of Au-free AlGaN/GaN-on-silicon Schottky barrier diodes under ON-state stress
Journal article2016, IEEE Transactions on Electron Devices, (63) 2, p.723-730