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Reliability of Au-free AlGaN/GaN-on-silicon Schottky barrier diodes under ON-state stress
Publication:
Reliability of Au-free AlGaN/GaN-on-silicon Schottky barrier diodes under ON-state stress
Date
2016
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Tallarico, Andrea N.
;
Stoffels, Steve
;
Magnone, P.
;
Hu, Jie
;
Lenci, Silvia
;
Marcon, Denis
;
Sangiorgi, E.
;
Fiegna, C.
;
Decoutere, Stefaan
Journal
IEEE Transactions on Electron Devices
Abstract
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1950
since deposited on 2021-10-23
Acq. date: 2025-10-23
Citations
Metrics
Views
1950
since deposited on 2021-10-23
Acq. date: 2025-10-23
Citations