Reliability of Au-free AlGaN/GaN-on-silicon Schottky barrier diodes under ON-state stress

dc.contributor.author	Tallarico, Andrea N.
dc.contributor.author	Stoffels, Steve
dc.contributor.author	Magnone, P.
dc.contributor.author	Hu, Jie
dc.contributor.author	Lenci, Silvia
dc.contributor.author	Marcon, Denis
dc.contributor.author	Sangiorgi, E.
dc.contributor.author	Fiegna, C.
dc.contributor.author	Decoutere, Stefaan
dc.contributor.imecauthor	Stoffels, Steve
dc.contributor.imecauthor	Lenci, Silvia
dc.contributor.imecauthor	Marcon, Denis
dc.contributor.imecauthor	Decoutere, Stefaan
dc.contributor.orcidimec	Decoutere, Stefaan::0000-0001-6632-6239
dc.date.accessioned	2021-10-23T15:25:45Z
dc.date.available	2021-10-23T15:25:45Z
dc.date.issued	2016
dc.identifier.issn	0018-9383
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/27376
dc.identifier.url	http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7373626
dc.source.beginpage	723
dc.source.endpage	730
dc.source.issue	2
dc.source.journal	IEEE Transactions on Electron Devices
dc.source.volume	63
dc.title	Reliability of Au-free AlGaN/GaN-on-silicon Schottky barrier diodes under ON-state stress
dc.type	Journal article
dspace.entity.type	Publication
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