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Browsing by Author "Tarutani, S."

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    Exploration of new resist chemistries and process methods for enabling dual-tone development

    Fonseca, Carlos
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    Somervell, M.
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    Scheer, S.
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    Kuwahara, Y.
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    Nafus, Kathleen  
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    Gronheid, Roel  
    Proceedings paper
    2009, 6th International Symposium on Immersion Lithography Extensions, 22/10/2009
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    Printing the contact and metal layers for the 32 and 22 nm node: comparing positive and negative development process

    Bekaert, Joost  
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    Van Look, Lieve  
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    Wiaux, Vincent  
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    Truffert, Vincent  
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    Maenhoudt, Mireille
    Proceedings paper
    2009, 6th International Symposium on Immersion Lithography Extensions, 22/10/2009
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    Unraveling the effect of resist composition on EUV optics contamination

    Pollentier, Ivan  
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    Neira, Imanol
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    Goethals, Mieke
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    Gronheid, Roel  
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    Tarutani, S.
    ;
    Tamaoki, H.
    Proceedings paper
    2011, Extreme Ultraviolet (EUV) Lithography II, 27/02/2011, p.79692L

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