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Browsing by Author "Tavares, J."

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    Growth of epitaxial b-FeSi2 on (100) silicon using Fe-Ti-Si diffusion couples

    Kyllesbech Larsen, K.
    ;
    Tavares, J.
    ;
    Bender, Hugo  
    ;
    Donaton, R. A.
    ;
    Lauwers, A.
    ;
    Maex, Karen  
    Journal article
    1995, J. Appl. Phys., (78) 1, p.599-601
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    HREM characterization of ion beam synthesized ternary silicides in (111) silicon

    Tavares, J.
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    Bender, Hugo  
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    Wu, Ming Fang
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    Vantomme, Andre  
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    Langouche, G.
    ;
    Lin, Chia-Hui
    Proceedings paper
    1995, Microscopy of Semiconducting Materials 1995. Proceedings, 20/03/1995, p.533-536
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    Ion beam synthesis of ternary phase CoFe-silicide in (111)Silicon

    Tavares, J.
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    Bender, Hugo  
    ;
    Wu, Ming Fang
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    Vantomme, Andre  
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    Langouche, G.
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    Lin, Chia-Hui
    Journal article
    1995, Appl. Phys. Lett., 67, p.986-988
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    Structural characterization of buried epitaxial b-FeSi2 layers in (111) silicon

    Tavares, J.
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    Bender, Hugo  
    ;
    Larsen, Kim Kyllesbech
    ;
    Lauwers, Anne  
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    Maex, Karen  
    ;
    Van Rossum, Marc
    Proceedings paper
    1994, Proceedings of the 13th International Conference on Electron Microscopy - ICEM, 17/07/1994, p.639-640
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    Synthesis of CoxFe1-xSi2 with high dose ion implantation and reactive codeposition epitaxy

    Vantomme, Andre  
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    Wu, Ming Fang
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    Degroote, S.
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    Dekoster, J.
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    Langouche, G.
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    Tavares, J.
    ;
    Bender, Hugo  
    Proceedings paper
    1995, Ion Implantation Technology - 94, 13/06/1994, p.926-929
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    Synthesis of CoxFe1-xSi2 with High-Dose Ion Implantation and Reactive Codeposition Epitaxy

    Vantomme, Andre  
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    Wu, Ming Fang
    ;
    Degroote, S.
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    Dekoster, J.
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    Langouche, G.
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    Tavares, J.
    ;
    Bender, Hugo  
    Oral presentation
    1994, 10th Conference on Ion Implantation Technology
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    The formation and thermal stability of ion-beam-synthesized ternary MexFe1-xSi2(Me=Co,Ni) in Si(111)

    Vantomme, Andre  
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    Wu, Ming Fang
    ;
    Langouche, G.
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    Tavares, J.
    ;
    Bender, Hugo  
    Journal article
    1995, Nuclear Instruments and Methods in Physics Research B, 106, p.404-408
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    Transmission electron microscopy characterization of ion beam synthesized FeSi2 layers

    Tavares, J.
    ;
    Bender, Hugo  
    ;
    Maex, Karen  
    Journal article
    1996, Thin Solid Films, 277, p.90-97

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