Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Articles
Transmission electron microscopy characterization of ion beam synthesized FeSi2 layers
Publication:
Transmission electron microscopy characterization of ion beam synthesized FeSi2 layers
Date
1996
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
1497.pdf
529.94 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Tavares, J.
;
Bender, Hugo
;
Maex, Karen
Journal
Thin Solid Films
Abstract
Description
Metrics
Views
1927
since deposited on 2021-09-29
420
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations
Metrics
Views
1927
since deposited on 2021-09-29
420
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations