Transmission electron microscopy characterization of ion beam synthesized FeSi2 layers

dc.contributor.author	Tavares, J.
dc.contributor.author	Bender, Hugo
dc.contributor.author	Maex, Karen
dc.contributor.imecauthor	Bender, Hugo
dc.contributor.imecauthor	Maex, Karen
dc.date.accessioned	2021-09-29T15:30:48Z
dc.date.available	2021-09-29T15:30:48Z
dc.date.embargo	9999-12-31
dc.date.issued	1996
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/1523
dc.source.beginpage	90
dc.source.endpage	97
dc.source.journal	Thin Solid Films
dc.source.volume	277
dc.title	Transmission electron microscopy characterization of ion beam synthesized FeSi2 layers
dc.type	Journal article
dspace.entity.type	Publication
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